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Merge "uwb(vts): Close HAL at end of each test" into tm-dev am: 987a7e3f30

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Original change: https://googleplex-android-review.googlesource.com/c/platform/hardware/interfaces/+/18840238

Change-Id: I4ba3e44e958c376b7a179690b975ecd199cb3e0d
Signed-off-by: Automerger Merge Worker <android-build-automerger-merge-worker@system.gserviceaccount.com>
This commit is contained in:
Roshan Pius
2022-06-13 17:41:23 +00:00
committed by Automerger Merge Worker
parent 63f222a32e 987a7e3f30
commit 0f696430d6
1 changed files with 5 additions and 0 deletions
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5
uwb/aidl/vts/VtsHalUwbTargetTest.cpp
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@@ -68,6 +68,11 @@ class UwbAidl : public testing::TestWithParam<std::string> {
iuwb_ = IUwb::fromBinder(SpAIBinder(AServiceManager_waitForService(GetParam().c_str())));
ASSERT_NE(iuwb_, nullptr);
}
virtual void TearDown() override {
// Trigger HAL close at end of each test.
const auto iuwb_chip = getAnyChip();
iuwb_chip->close();
}
std::shared_ptr<IUwb> iuwb_;
// TODO (b/197638976): We pick the first chip here. Need to fix this