Evolution-x/hardware_interfaces
1
0
Fork 0
mirror of https://github.com/Evolution-X/hardware_interfaces synced 2026-02-01 21:37:44 +00:00
Code Issues Packages Projects Releases Wiki Activity

Merge "Extend test timeout value from 180s to 600s" am: 276369a3df

Browse Source 
Original change: https://android-review.googlesource.com/c/platform/hardware/interfaces/+/1525581

MUST ONLY BE SUBMITTED BY AUTOMERGER

Change-Id: I16ae7e3114b89738237b8ab6d1cbe586162663e9
This commit is contained in:
Treehugger Robot
2020-12-16 04:00:45 +00:00
committed by Automerger Merge Worker
parent 34277b9a6b 276369a3df
commit 29a6aa191d
1 changed files with 1 additions and 1 deletions
Download Patch File Download Diff File Expand all files Collapse all files

2
nfc/1.0/vts/functional/AndroidTest.xml
View File

@@ -28,6 +28,6 @@
<test class="com.android.tradefed.testtype.GTest" > <test class="com.android.tradefed.testtype.GTest" >
<option name="native-test-device-path" value="/data/local/tmp" /> <option name="native-test-device-path" value="/data/local/tmp" />
<option name="module-name" value="VtsHalNfcV1_0TargetTest" /> <option name="module-name" value="VtsHalNfcV1_0TargetTest" />
<option name="native-test-timeout" value="180000"/> <option name="native-test-timeout" value="600000"/>
</test> </test>
</configuration> </configuration>