diff --git a/ir/1.0/vts/functional/Android.bp b/ir/1.0/vts/functional/Android.bp
index f5c9d61055..f9edebdb96 100644
--- a/ir/1.0/vts/functional/Android.bp
+++ b/ir/1.0/vts/functional/Android.bp
@@ -21,5 +21,5 @@ cc_test {
     static_libs: [
         "android.hardware.ir@1.0",
     ],
-    test_suites: ["general-tests"],
+    test_suites: ["general-tests", "vts-core"],
 }
diff --git a/ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp b/ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp
index 5fd2dd4c77..a5dbdccb9b 100644
--- a/ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp
+++ b/ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp
@@ -21,8 +21,9 @@
 #include <android/hardware/ir/1.0/IConsumerIr.h>
 #include <android/hardware/ir/1.0/types.h>
 
-#include <VtsHalHidlTargetTestBase.h>
-#include <VtsHalHidlTargetTestEnvBase.h>
+#include <gtest/gtest.h>
+#include <hidl/GtestPrinter.h>
+#include <hidl/ServiceManagement.h>
 #include <algorithm>
 
 using ::android::hardware::ir::V1_0::IConsumerIr;
@@ -31,26 +32,10 @@ using ::android::hardware::hidl_vec;
 using ::android::hardware::Return;
 using ::android::sp;
 
-// Test environment for Ir
-class ConsumerIrHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
- public:
-  // get the test environment singleton
-  static ConsumerIrHidlEnvironment* Instance() {
-    static ConsumerIrHidlEnvironment* instance = new ConsumerIrHidlEnvironment;
-    return instance;
-  }
-
-  virtual void registerTestServices() override { registerTestService<IConsumerIr>(); }
- private:
-  ConsumerIrHidlEnvironment() {}
-};
-
-// The main test class for IR HIDL HAL.
-class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase {
+class ConsumerIrHidlTest : public ::testing::TestWithParam<std::string> {
  public:
   virtual void SetUp() override {
-    ir = ::testing::VtsHalHidlTargetTestBase::getService<IConsumerIr>(
-      ConsumerIrHidlEnvironment::Instance()->getServiceName<IConsumerIr>());
+    ir = IConsumerIr::getService(GetParam());
     ASSERT_NE(ir, nullptr);
   }
 
@@ -60,7 +45,7 @@ class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase {
 };
 
 // Test transmit() for the min and max frequency of every available range
-TEST_F(ConsumerIrHidlTest, TransmitTest) {
+TEST_P(ConsumerIrHidlTest, TransmitTest) {
   bool success;
   hidl_vec<ConsumerIrFreqRange> ranges;
   auto cb = [&](bool s, hidl_vec<ConsumerIrFreqRange> v) {
@@ -84,7 +69,7 @@ TEST_F(ConsumerIrHidlTest, TransmitTest) {
 }
 
 // Test transmit() when called with invalid frequencies
-TEST_F(ConsumerIrHidlTest, BadFreqTest) {
+TEST_P(ConsumerIrHidlTest, BadFreqTest) {
   uint32_t len = 16;
   hidl_vec<int32_t> vec;
   vec.resize(len);
@@ -92,11 +77,7 @@ TEST_F(ConsumerIrHidlTest, BadFreqTest) {
   EXPECT_FALSE(ir->transmit(-1, vec));
 }
 
-int main(int argc, char **argv) {
-  ::testing::AddGlobalTestEnvironment(ConsumerIrHidlEnvironment::Instance());
-  ::testing::InitGoogleTest(&argc, argv);
-  ConsumerIrHidlEnvironment::Instance()->init(&argc, argv);
-  int status = RUN_ALL_TESTS();
-  LOG(INFO) << "Test result = " << status;
-  return status;
-}
+INSTANTIATE_TEST_SUITE_P(
+        PerInstance, ConsumerIrHidlTest,
+        testing::ValuesIn(android::hardware::getAllHalInstanceNames(IConsumerIr::descriptor)),
+        android::hardware::PrintInstanceNameToString);