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Merge "[vts-core] add VtsHalIrV1_0TargetTest to vts-core"

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am: 51d32a6881

Change-Id: I7bd0642127f15f2efeaab6875cdbbd9a6ddf162e
This commit is contained in:
nelsonli
2019-10-29 19:14:51 -07:00
committed by android-build-merger
parent fd02941c1a 51d32a6881
commit 823a602dcc
2 changed files with 12 additions and 31 deletions
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2
ir/1.0/vts/functional/Android.bp
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@@ -21,5 +21,5 @@ cc_test {
static_libs: [
"android.hardware.ir@1.0",
],
test_suites: ["general-tests"],
test_suites: ["general-tests", "vts-core"],
}

41
ir/1.0/vts/functional/VtsHalIrV1_0TargetTest.cpp
View File

@@ -21,8 +21,9 @@
#include <android/hardware/ir/1.0/IConsumerIr.h>
#include <android/hardware/ir/1.0/types.h>
#include <VtsHalHidlTargetTestBase.h>
#include <VtsHalHidlTargetTestEnvBase.h>
#include <gtest/gtest.h>
#include <hidl/GtestPrinter.h>
#include <hidl/ServiceManagement.h>
#include <algorithm>
using ::android::hardware::ir::V1_0::IConsumerIr;
@@ -31,26 +32,10 @@ using ::android::hardware::hidl_vec;
using ::android::hardware::Return;
using ::android::sp;
// Test environment for Ir
class ConsumerIrHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
public:
// get the test environment singleton
static ConsumerIrHidlEnvironment* Instance() {
static ConsumerIrHidlEnvironment* instance = new ConsumerIrHidlEnvironment;
return instance;
}
virtual void registerTestServices() override { registerTestService<IConsumerIr>(); }
private:
ConsumerIrHidlEnvironment() {}
};
// The main test class for IR HIDL HAL.
class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase {
class ConsumerIrHidlTest : public ::testing::TestWithParam<std::string> {
public:
virtual void SetUp() override {
ir = ::testing::VtsHalHidlTargetTestBase::getService<IConsumerIr>(
ConsumerIrHidlEnvironment::Instance()->getServiceName<IConsumerIr>());
ir = IConsumerIr::getService(GetParam());
ASSERT_NE(ir, nullptr);
}
@@ -60,7 +45,7 @@ class ConsumerIrHidlTest : public ::testing::VtsHalHidlTargetTestBase {
};
// Test transmit() for the min and max frequency of every available range
TEST_F(ConsumerIrHidlTest, TransmitTest) {
TEST_P(ConsumerIrHidlTest, TransmitTest) {
bool success;
hidl_vec<ConsumerIrFreqRange> ranges;
auto cb = [&](bool s, hidl_vec<ConsumerIrFreqRange> v) {
@@ -84,7 +69,7 @@ TEST_F(ConsumerIrHidlTest, TransmitTest) {
}
// Test transmit() when called with invalid frequencies
TEST_F(ConsumerIrHidlTest, BadFreqTest) {
TEST_P(ConsumerIrHidlTest, BadFreqTest) {
uint32_t len = 16;
hidl_vec<int32_t> vec;
vec.resize(len);
@@ -92,11 +77,7 @@ TEST_F(ConsumerIrHidlTest, BadFreqTest) {
EXPECT_FALSE(ir->transmit(-1, vec));
}
int main(int argc, char **argv) {
::testing::AddGlobalTestEnvironment(ConsumerIrHidlEnvironment::Instance());
::testing::InitGoogleTest(&argc, argv);
ConsumerIrHidlEnvironment::Instance()->init(&argc, argv);
int status = RUN_ALL_TESTS();
LOG(INFO) << "Test result = " << status;
return status;
}
INSTANTIATE_TEST_SUITE_P(
PerInstance, ConsumerIrHidlTest,
testing::ValuesIn(android::hardware::getAllHalInstanceNames(IConsumerIr::descriptor)),
android::hardware::PrintInstanceNameToString);