From 54abf5632a445ea1477dead989dc5ad61a5e8550 Mon Sep 17 00:00:00 2001
From: Zhuoyao Zhang <zhuoyao@google.com>
Date: Wed, 25 Jan 2017 15:44:45 -0800
Subject: [PATCH] Increase the timeout for NfcHidlTargetProfilingTest.

* Given there's still test failue due to timeout:
  https://android-vts-internal.googleplex.com/show_table?testName=NfcHidlTargetProfilingTest,
  increased the limit to 25m.

Test: run vts -m NfcHidlTargetProfilingTest
Change-Id: Ie5fee6a399281ec538e6724207916908bb8da4d0
---
 .../vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
index 42c7e22cb9..3b570f984e 100644
--- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
+++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
@@ -25,7 +25,7 @@
             _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test,
             "/>
         <option name="binary-test-type" value="gtest" />
-        <option name="test-timeout" value="20m" />
+        <option name="test-timeout" value="25m" />
     <option name="enable-profiling" value="true" />
     </test>
 </configuration>