From 3ba0e635e1e04c05a0142f4f02bb423c71acae17 Mon Sep 17 00:00:00 2001
From: Roshan Pius <rpius@google.com>
Date: Fri, 10 Jun 2022 19:57:41 +0000
Subject: [PATCH] uwb(vts): Close HAL at end of each test

Bug: 235558748
Test: atest VtsHalUwbTargetTest
Change-Id: I5361baab1f9204052e0f625b3c17242fbfe66190
---
 uwb/aidl/vts/VtsHalUwbTargetTest.cpp | 5 +++++
 1 file changed, 5 insertions(+)

diff --git a/uwb/aidl/vts/VtsHalUwbTargetTest.cpp b/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
index edd8dd6608..81d26ba06b 100644
--- a/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
+++ b/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
@@ -68,6 +68,11 @@ class UwbAidl : public testing::TestWithParam<std::string> {
         iuwb_ = IUwb::fromBinder(SpAIBinder(AServiceManager_waitForService(GetParam().c_str())));
         ASSERT_NE(iuwb_, nullptr);
     }
+    virtual void TearDown() override {
+        // Trigger HAL close at end of each test.
+        const auto iuwb_chip = getAnyChip();
+        iuwb_chip->close();
+    }
     std::shared_ptr<IUwb> iuwb_;
 
     // TODO (b/197638976): We pick the first chip here. Need to fix this