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Merge "Increase challenge size in tests."

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Max Bires
2022-04-21 07:37:05 +00:00
committed by Gerrit Code Review
parent 7f923b326b 89c7488370
commit dcaa803893
2 changed files with 3 additions and 3 deletions
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3
security/keymint/aidl/android/hardware/security/keymint/ProtectedData.aidl
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@@ -106,7 +106,8 @@ parcelable ProtectedData {
* ] * ]
* *
* SignedMacAad = [ * SignedMacAad = [
* challenge : bstr, * challenge : bstr .size (32..64), // Size between 32 - 64
* // bytes inclusive
* VerifiedDeviceInfo, * VerifiedDeviceInfo,
* tag: bstr // This is the tag from COSE_Mac0 of * tag: bstr // This is the tag from COSE_Mac0 of
* // KeysToCertify, to tie the key set to * // KeysToCertify, to tie the key set to

3
security/keymint/aidl/vts/functional/VtsRemotelyProvisionedComponentTests.cpp
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@@ -358,8 +358,7 @@ TEST_P(GenerateKeyTests, generateEcdsaP256Key_testMode) {
class CertificateRequestTest : public VtsRemotelyProvisionedComponentTests { class CertificateRequestTest : public VtsRemotelyProvisionedComponentTests {
protected: protected:
CertificateRequestTest() : eekId_(string_to_bytevec("eekid")), challenge_(randomBytes(32)) { CertificateRequestTest() : eekId_(string_to_bytevec("eekid")), challenge_(randomBytes(64)) {}
}
void generateTestEekChain(size_t eekLength) { void generateTestEekChain(size_t eekLength) {
auto chain = generateEekChain(rpcHardwareInfo.supportedEekCurve, eekLength, eekId_); auto chain = generateEekChain(rpcHardwareInfo.supportedEekCurve, eekLength, eekId_);