The Bluetooth specification doesn't require data credits
to come back within a specific timeframe, so the VTS test
can not require it.
Bug: 65269854
Test: VtsHalBlueoothV1_0TargetTest with simulated chip (no credits)
Change-Id: If2fc052d3b5236f6a3097f3d5403882226561404
AsyncFdWatcher thread notification pipe fds without close
which causes FD leak under Bluetooth on/off stress test.
Close the notification pipe fds when shut down Bluetooth.
Test: Bluetooth on/off stress test
Change-Id: I7575adec49161f9764f0e070ef3c1043b8295a97
Do not crash in the vendor layer. The stack will crash
when it fails to initialize.
Bug: 64535243
Test: Bluetooth starts/stops
Change-Id: I69fdd2879c80fa2f006c50f0a42a85e9289b14fe
An invalid type byte can cause an access outside
the bounds of the array.
Bug: 64565737
Test: Bluetooth On/Off
Change-Id: Ie11dd62942f66b9fc60ebce2e4339c37d597fdf0
Opening the serial port(s) returns -1 when it fails, check
that the number of file descriptors is greater than 0 and
less than the size of the array.
Test: VtsHalBluetoothV1_0TargetTest, Bluetooth start/stop
Bug: 64420262
Change-Id: Icbffa5bd8c02030e389bac03aa5e1e78cc3c6057
Removes redundant "java-static" target.
Note, targets aren't removed here which have internal
targets that depend on them.
Bug: 36376126
Test: pass
Change-Id: I830f02e5f219d2d58721132c358d2783c3942eac
hwbinder.jar will be used instead of framework.jar on build-time, but
on runtime framework.jar will be used.
This is to cut the circular dependency when using configstore from
Android framework.
Bug: 35771640
Test: no test.
Change-Id: I04cab676c91d2ea423f5e2c1b2b9efa15e522f37
Allow them to be static.
This is required for a couple of reasons:
- enabling HIDL passthrough in recovery
- enabling VTS tests to be static blobs
Bug: 32920003
Bug: 64040096
Test: update-all-google-makefiles.sh
Change-Id: I1b2401fb273ab80819e3870aa71fe742269674ba
The byte offsets for Packet Boundary (PB) and Broadcast (BC) flags
in the HCI ACL Header is swapped. This will fixed it so that it matches
the Bluetooth Specifications.
Bug: 63241720
Test: Run manual VTS tests for Bluetooth
Change-Id: Ifc1f4d4f054a1dab13458c563e47bfb884f39d92
* Add libbluetooth-types - library containing types implementation, that
is common between stystem/bt and packages/apps/Bluetooth. It must be
included in every project using btif interface.
* Put Raw Address implementation into libbluetooth-types
* Unify all "to/from string" helper methods into ToString and FromString
* bd_addr_empty -> RawAddress::kEmpty
* bd_addr_any -> RawAddress::kAny
Also fix leaks in jni str2addr by adding ReleaseStringUTFChars
Test: types_unittest
Change-Id: I7dca82ec2293ae5338a9500dd6aa43b59d25657a
Merged-In: I7dca82ec2293ae5338a9500dd6aa43b59d25657a
If to send type and data separately for one HCI packet,
it will cause two system call context switch to kernel space,
which will introduce software overhead on data path.
Plus, if vendor does not use pure UART interface, it causes different
data behavior on BUS and may not adapt to all vendors as legacy HAL did.
Considering backward-compatibility, to use writev to send
type and data together once as legacy BT HAL did.
Test: H4 UTTest, BT VTS test, Bluetooth on/off
Change-Id: I2d93085fe0c01b48d0e3729a3fa85b5b27335b2c
