Dice HAL: Add VTS Test.

This CL adds a VTS test for the DICE HAL, and a test specific for
demotion testing. Demotion testing leaves the device in a permanently
modified state untill the next reboot, which is why it needs a special
test config. The current test config restarts the device before testing,
in a followup the device also has to reboot after the test.

Bug: 198197213
Test: atest VtsAidlDiceTargetTest
      atest VtsAidlDiceDemoteTargetTest
Change-Id: I4278a1352df749da50dc8e5d118fc37336026061

security/dice/aidl/vts/functional/Android.bp

@@ -0,0 +1,54 @@
+package {
+    // See: http://go/android-license-faq
+    // A large-scale-change added 'default_applicable_licenses' to import
+    // all of the 'license_kinds' from "hardware_interfaces_license"
+    // to get the below license kinds:
+    //   SPDX-license-identifier-Apache-2.0
+    default_applicable_licenses: ["hardware_interfaces_license"],
+}
+
+rust_test {
+    name: "VtsAidlDiceTargetTest",
+    srcs: [
+        "dice_test.rs",
+    ],
+    require_root: true,
+    auto_gen_config: true,
+    test_suites: [
+        "general-tests",
+        "vts",
+    ],
+
+    rustlibs: [
+        "android.hardware.security.dice-V1-rust",
+        "libanyhow",
+        "libbinder_rs",
+        "libdiced_open_dice_cbor",
+        "libdiced_sample_inputs",
+        "libdiced_utils",
+        "libkeystore2_vintf_rust",
+    ],
+}
+
+rust_test {
+    name: "VtsAidlDiceDemoteTargetTest",
+    srcs: [
+        "dice_demote_test.rs",
+    ],
+
+    test_config: "VtsAidlDiceDemoteTargetTest.xml",
+    test_suites: [
+        "general-tests",
+        "vts",
+    ],
+
+    rustlibs: [
+        "android.hardware.security.dice-V1-rust",
+        "libanyhow",
+        "libbinder_rs",
+        "libdiced_open_dice_cbor",
+        "libdiced_sample_inputs",
+        "libdiced_utils",
+        "libkeystore2_vintf_rust",
+    ],
+}

security/dice/aidl/vts/functional/VtsAidlDiceDemoteTargetTest.xml

@@ -0,0 +1,33 @@
+<?xml version="1.0" encoding="utf-8"?>
+<!-- Copyright (C) 2019 The Android Open Source Project
+
+     Licensed under the Apache License, Version 2.0 (the "License");
+     you may not use this file except in compliance with the License.
+     You may obtain a copy of the License at
+
+          http://www.apache.org/licenses/LICENSE-2.0
+
+     Unless required by applicable law or agreed to in writing, software
+     distributed under the License is distributed on an "AS IS" BASIS,
+     WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+     See the License for the specific language governing permissions and
+     limitations under the License.
+-->
+
+<configuration description="Config to run VtsAidlDiceDemoteTargetTest device tests.">
+
+    <target_preparer class="com.android.tradefed.targetprep.RootTargetPreparer">
+    </target_preparer>
+
+    <target_preparer class="com.android.tradefed.targetprep.PushFilePreparer">
+        <option name="cleanup" value="true" />
+        <option name="push" value="VtsAidlDiceDemoteTargetTest->/data/local/tmp/VtsAidlDiceDemoteTargetTest" />
+    </target_preparer>
+
+    <test class="com.android.tradefed.testtype.rust.RustBinaryTest" >
+        <option name="test-device-path" value="/data/local/tmp" />
+        <option name="module-name" value="VtsAidlDiceDemoteTargetTest" />
+    </test>
+    <target_preparer class="com.android.tradefed.targetprep.RebootTargetPreparer" />
+
+</configuration>

security/dice/aidl/vts/functional/dice_demote_test.rs

@@ -0,0 +1,67 @@
+// Copyright 2021, The Android Open Source Project
+//
+// Licensed under the Apache License, Version 2.0 (the "License");
+// you may not use this file except in compliance with the License.
+// You may obtain a copy of the License at
+//
+//     http://www.apache.org/licenses/LICENSE-2.0
+//
+// Unless required by applicable law or agreed to in writing, software
+// distributed under the License is distributed on an "AS IS" BASIS,
+// WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+// See the License for the specific language governing permissions and
+// limitations under the License.
+
+use diced_open_dice_cbor as dice;
+use diced_sample_inputs;
+use diced_utils;
+use std::convert::TryInto;
+
+mod utils;
+use utils::with_connection;
+
+// This test calls derive with an empty argument vector, then demotes the HAL using
+// a set of three input values, and then calls derive with empty argument vector again.
+// It then performs the same three derivation steps on the result of the former and compares
+// the result to the result of the latter.
+#[test]
+fn demote_test() {
+    with_connection(|device| {
+        let input_values = diced_sample_inputs::get_input_values_vector();
+        let former = device.derive(&[]).expect("Trying to call derive.");
+        device
+            .demote(&input_values)
+            .expect("Trying to call demote with input values.");
+
+        let latter = device
+            .derive(&[])
+            .expect("Trying to call derive after demote.");
+
+        let artifacts = diced_utils::ResidentArtifacts::new(
+            former.cdiAttest[..].try_into().unwrap(),
+            former.cdiSeal[..].try_into().unwrap(),
+            &former.bcc.data,
+        )
+        .unwrap();
+
+        let input_values: Vec<diced_utils::InputValues> = input_values
+            .iter()
+            .map(|v| v.into())
+            .collect();
+
+        let artifacts = artifacts
+            .execute_steps(input_values.iter().map(|v| v as &dyn dice::InputValues))
+            .unwrap();
+        let (cdi_attest, cdi_seal, bcc) = artifacts.into_tuple();
+        let from_former = diced_utils::make_bcc_handover(
+            cdi_attest[..].try_into().unwrap(),
+            cdi_seal[..].try_into().unwrap(),
+            &bcc,
+        )
+        .unwrap();
+        // TODO b/204938506 when we have a parser/verifier, check equivalence rather
+        // than bit by bit equality.
+        assert_eq!(latter, from_former);
+        Ok(())
+    })
+}

security/dice/aidl/vts/functional/dice_test.rs

@@ -0,0 +1,82 @@
+// Copyright 2021, The Android Open Source Project
+//
+// Licensed under the Apache License, Version 2.0 (the "License");
+// you may not use this file except in compliance with the License.
+// You may obtain a copy of the License at
+//
+//     http://www.apache.org/licenses/LICENSE-2.0
+//
+// Unless required by applicable law or agreed to in writing, software
+// distributed under the License is distributed on an "AS IS" BASIS,
+// WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+// See the License for the specific language governing permissions and
+// limitations under the License.
+
+use diced_open_dice_cbor as dice;
+use diced_sample_inputs;
+use diced_utils;
+use std::convert::{TryInto, Into};
+
+mod utils;
+use utils::with_connection;
+
+static TEST_MESSAGE: &[u8] = &[
+    // "My test message!"
+    0x4d, 0x79, 0x20, 0x74, 0x65, 0x73, 0x74, 0x20, 0x6d, 0x65, 0x73, 0x73, 0x61, 0x67, 0x65, 0x21,
+    0x0a,
+];
+
+// This test calls derive with an empty argument vector and with a set of three input values.
+// It then performs the same three derivation steps on the result of the former and compares
+// the result to the result of the latter.
+#[test]
+fn equivalence_test() {
+    with_connection(|device| {
+        let input_values = diced_sample_inputs::get_input_values_vector();
+        let former = device.derive(&[]).expect("Trying to call derive.");
+        let latter = device
+            .derive(&input_values)
+            .expect("Trying to call derive with input values.");
+        let artifacts = diced_utils::ResidentArtifacts::new(
+            former.cdiAttest[..].try_into().unwrap(),
+            former.cdiSeal[..].try_into().unwrap(),
+            &former.bcc.data,
+        )
+        .unwrap();
+
+        let input_values: Vec<diced_utils::InputValues> = input_values
+            .iter()
+            .map(|v| v.into())
+            .collect();
+
+        let artifacts = artifacts
+            .execute_steps(input_values.iter().map(|v| v as &dyn dice::InputValues))
+            .unwrap();
+        let (cdi_attest, cdi_seal, bcc) = artifacts.into_tuple();
+        let from_former = diced_utils::make_bcc_handover(
+            cdi_attest[..].try_into().unwrap(),
+            cdi_seal[..].try_into().unwrap(),
+            &bcc,
+        )
+        .unwrap();
+        // TODO b/204938506 when we have a parser/verifier, check equivalence rather
+        // than bit by bit equality.
+        assert_eq!(latter, from_former);
+        Ok(())
+    })
+}
+
+#[test]
+fn sign_and_verify() {
+    with_connection(|device| {
+        let _signature = device
+            .sign(&[], TEST_MESSAGE)
+            .expect("Trying to call sign.");
+
+        let _bcc = device
+            .getAttestationChain(&[])
+            .expect("Trying to call getAttestationChain.");
+        // TODO b/204938506 check the signature with the bcc when the verifier is available.
+        Ok(())
+    })
+}

security/dice/aidl/vts/functional/utils.rs

@@ -0,0 +1,53 @@
+// Copyright 2021, The Android Open Source Project
+//
+// Licensed under the Apache License, Version 2.0 (the "License");
+// you may not use this file except in compliance with the License.
+// You may obtain a copy of the License at
+//
+//     http://www.apache.org/licenses/LICENSE-2.0
+//
+// Unless required by applicable law or agreed to in writing, software
+// distributed under the License is distributed on an "AS IS" BASIS,
+// WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+// See the License for the specific language governing permissions and
+// limitations under the License.
+
+use android_hardware_security_dice::aidl::android::hardware::security::dice::IDiceDevice::IDiceDevice;
+use anyhow::Result;
+use binder::Strong;
+use keystore2_vintf::get_aidl_instances;
+use std::sync::Arc;
+
+static DICE_DEVICE_SERVICE_NAME: &str = &"android.hardware.security.dice";
+static DICE_DEVICE_INTERFACE_NAME: &str = &"IDiceDevice";
+
+/// This function iterates through all announced IDiceDevice services and runs the given test
+/// closure against connections to each of them. It also modifies the panic hook to indicate
+/// on which instance the test failed in case the test closure panics.
+pub fn with_connection<R, F>(test: F)
+where
+    F: Fn(&Strong<dyn IDiceDevice>) -> Result<R>,
+{
+    let instances = get_aidl_instances(DICE_DEVICE_SERVICE_NAME, 1, DICE_DEVICE_INTERFACE_NAME);
+    let panic_hook = Arc::new(std::panic::take_hook());
+    for i in instances.into_iter() {
+        let panic_hook_clone = panic_hook.clone();
+        let instance_clone = i.clone();
+        std::panic::set_hook(Box::new(move |v| {
+            println!("While testing instance: \"{}\"", instance_clone);
+            panic_hook_clone(v)
+        }));
+        let connection: Strong<dyn IDiceDevice> = binder::get_interface(&format!(
+            "{}.{}/{}",
+            DICE_DEVICE_SERVICE_NAME, DICE_DEVICE_INTERFACE_NAME, i
+        ))
+        .unwrap();
+        test(&connection).unwrap();
+        drop(std::panic::take_hook());
+    }
+    // Cannot call unwrap here because the panic hook is not Debug.
+    std::panic::set_hook(match Arc::try_unwrap(panic_hook) {
+        Ok(hook) => hook,
+        _ => panic!("Failed to unwrap and reset previous panic hook."),
+    })
+}