The code needed to be adpated because the public fields the code
accessed previously now become private. We need to access them
via the trait now.
This cl also deletes unused dependence libdiced_open_dice_cbor in
the dice service and tests targets.
Bug: 267575445
Test: m android.hardware.security.dice-service.non-secure-software
Test: atest VtsAidlDiceTargetTest VtsAidlDiceDemoteTargetTest
Change-Id: I16e18226c0bce8a90ed764ba598e90e7c1c854ab
This is part of the project of merging the two existing dice
wrapper libraries into the library libdiced_open_dice to
improve maintainability.
Bug: 267575445
Test: m android.hardware.security.dice-service.non-secure-software
Test: atest VtsAidlDiceTargetTest VtsAidlDiceDemoteTargetTest
Change-Id: If9ee66a320775897342f53d58ee11405a8e70c6f
Some are still in VNDK because they are used in other VNDK libs.
Ignore-AOSP-First: some libs are still in internal master only.
Bug: 234181591
Test: m
Merged-In: If999df9c78a20df931177da11742b1c5de19bc08
Change-Id: If999df9c78a20df931177da11742b1c5de19bc08
(cherry picked from commit 5527adfd7f)
This CL adds a VTS test for the DICE HAL, and a test specific for
demotion testing. Demotion testing leaves the device in a permanently
modified state untill the next reboot, which is why it needs a special
test config. The current test config restarts the device before testing,
in a followup the device also has to reboot after the test.
Bug: 198197213
Test: atest VtsAidlDiceTargetTest
atest VtsAidlDiceDemoteTargetTest
Change-Id: I4278a1352df749da50dc8e5d118fc37336026061
The dice HAL provides access to the Dice artifacts of the running Android
instance.
Bug: 198197213
Test: VTS test comming in two ...
Change-Id: I6e84f9a9c7153e7a96c06d1d451e658b3f222586
