mirror of
https://github.com/Evolution-X/hardware_interfaces
synced 2026-02-01 16:50:18 +00:00
18a1915f049e8f114ccebe217fffef677bfb30a7
It's already documented that IRPC v3 doesn't make use of test mode keys however VTS still required support for their generation. Fix this and simplify implementation of the v3 HAL by expecting an error in all cases that the deprecated test mode keys are seen. IRPC v3 also fully deprecated the EEK meaning a v3 implementation must unconditionally report CURVE_NONE for supportedEekCurve. The VTS tests are enhanced with contextual version constants rather than reusing constants with seemingly unrelated names. Bug: 278013975 Test: atest VtsHalRemotelyProvisionedComponentTargetTest (cherry picked from https://android-review.googlesource.com/q/commit:f2ae193680d6f02a2394423f805aadd13a7d152b) Merged-In: I5709a0b1cd77eb28e677f64bb781fad58d91570a Change-Id: I5709a0b1cd77eb28e677f64bb781fad58d91570a
Merge "Update common.fmq aidl_interface with versions_with_info" am:
35d4efc9e9 am: d4d38f8116 am: 3d96c8e4de
Merge "Fix VTS generated test with reusable execution." am:
c2f025e250 am: c6d9dfa6df am: 3917606102
Merge "CEC : fix VtsHalTvCecV1_0TargetTest SendMessage test failed." am:
c054e7fda9 am: 2c01719f44 am: 1ef37ce895
Merge "Revert "Revert "uwb(hal): Implement UCI over serial in the defau..."" am:
29567e796b am: 57cccf0cd7 am: 33fc82390c
Description
No description provided
Languages
C++
56.3%
AIDL
41.2%
C
1.5%
Rust
0.4%
Java
0.4%
Other
0.1%