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https://github.com/Evolution-X/hardware_interfaces
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3bbcbcdc8a9194a84c612cb5b7f56d2fbce72877
The current fuzz testing comunicates with the Thread radio chip simulation program `ot-rcp`. The 'ot-rcp' is not installed by all devices, which causes the fuzz testing program is unable to find the program '/vendor/bin/ot-rcp'. This commit enables the HAL to talk to the '/dev/null' to avoid '/vendor/bin/ot-rcp' not being found. Bug: 289627270 Test: Run the fuzz test on cuttlefish (cherry picked from https://android-review.googlesource.com/q/commit:7f7e8647fa94b9d126cb88f366740f2b50b1f864) Merged-In: If410d7d75abe05c7c2d2c82fa0450e925b9a48bb Change-Id: If410d7d75abe05c7c2d2c82fa0450e925b9a48bb
Increase frame counters in the same critical section am:
928a4535c8 am: a343d0cf0c am: c070b5a14b am: 55baee93d6 am: e0868c4484 am: ca64f5b140
Merge "Fix vts sco test fail for usb interface" into stage-aosp-udc-ts-dev am:
bcd8ee707d am: 4ba38df718
Merge "Update common.fmq aidl_interface with versions_with_info" am:
35d4efc9e9 am: d4d38f8116 am: 3d96c8e4de
Merge "Fix VTS generated test with reusable execution." am:
c2f025e250 am: c6d9dfa6df am: 3917606102
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